Final day of ASTR 2017 at Austin Hilton Garden Inn
Neil Doertenbach “Mitigating Design and production Risk with HALT, HAST and HASS”
Josh Verhage “A case Study of Reliability Testing mixed with Experimental Design”
Keisuke Matsui “An effectiveness Assessment of HALT technique and its equipment”
Fred Lane “Reliability of Al Wire Grid Arrays under High Light Flux Condition”
Gary Hazard/ Alpana Gangopadhyaya “Rapid Precipitation and Mitigation of Intermittent Faults”
Jim McLInn “Accelerated Mechanical Testing”