On Thu, Jan 13, 2022, Manju Maheve presented:
ASQ RRD series webinar: Understanding the impact of Single Event Effects (SEE) on System Safety
The trend of current design practices with an improvement of integrated circuit technology, chips contain more and more functions resulting into increased device density. For airborne electronic hardware, the radiation effect poses more and more hidden dangers to the safety of aircraft. According to the current technological trends, in the next decade, if civil aircraft continues to use a large number of highly integrated electronic components and microprocessors, taking additional protective measures, then the average probability of catastrophic failure conditions caused by radiation-induced failure of aircraft hardware and software in the next decade will increase by at least 10 times. This will be a major risk to aviation safety. Therefore, the Single Event Effects (SEE) problem needs to be taken into account at the Preliminary System Safety Assessment process considering the system criticality and contribution of the system to catastrophic and/or hazardous failure conditions. The analysis will help to determine of whether or not the SEE error rate is acceptable with regard to the safety objectives.
The purpose of this presentation is to provide an overview of SEE and the impact of SEE on the system functionality. This presentation will also provide an insight on how to perform Safety analysis considering SEE and to develop mitigation techniques.
